Invention Grant
- Patent Title: Three-dimensional measurement apparatus, three-dimensional measurement method and program
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Application No.: US16166213Application Date: 2018-10-22
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Publication No.: US10600193B2Publication Date: 2020-03-24
- Inventor: Xingdou Fu , Masaki Suwa
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto-shi
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto-shi
- Agency: Metrolex IP Law Group, PLLC
- Priority: JP2017-211840 20171101
- Main IPC: G06T7/521
- IPC: G06T7/521 ; G06T7/73 ; G06T7/593 ; G01B11/25
Abstract:
Three-dimensional measurement is performed by projecting patterned light having a hybrid pattern Ph onto a measurement target. The hybrid pattern Ph is a pattern in which a random pattern Pr is superimposed on a structured light pattern Ps, and is arranged in pattern such that the random pattern Pr and the structured light pattern Ps do not interfere mutually.
Public/Granted literature
- US20190130589A1 THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREMENT METHOD AND PROGRAM Public/Granted day:2019-05-02
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