Invention Grant
- Patent Title: Sampling circuit and semiconductor memory device using a sampling circuit
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Application No.: US16189443Application Date: 2018-11-13
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Publication No.: US10600457B2Publication Date: 2020-03-24
- Inventor: Bo Ram Kim , Dae Han Kwon
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si, Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si, Gyeonggi-do
- Agency: William Park & Associates Ltd.
- Priority: KR10-2018-0043929 20180416
- Main IPC: G06F1/12
- IPC: G06F1/12 ; G11C7/22 ; G11C7/10 ; G11C11/40

Abstract:
A sampling circuit may include a first timing determination circuit, a second timing determination circuit, and a sampling data output circuit. The first timing determination circuit may determine a first timing of sampling data in response to a first sampling timing signal. The second timing determination circuit may determine a second timing of the sampling data in response to a second sampling timing signal. The sampling data output circuit may output the sampling data having effective data values of the data between the first timing and the second timing in response to outputs from the first and second timing determination circuits.
Public/Granted literature
- US20190318772A1 SAMPLING CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE USING A SAMPLING CIRCUIT Public/Granted day:2019-10-17
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