Invention Grant
- Patent Title: Semiconductor device and manufacture thereof
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Application No.: US15964447Application Date: 2018-04-27
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Publication No.: US10600650B2Publication Date: 2020-03-24
- Inventor: Dae Sub Jung , De Yan Chen , Guang Li Yang
- Applicant: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION , SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
- Applicant Address: CN CN
- Assignee: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION,SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
- Current Assignee: SEMICONDUCTOR MANUFACTURING INTERNATIONAL (SHANGHAI) CORPORATION,SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION
- Current Assignee Address: CN CN
- Agency: Innovation Counsel LLP
- Priority: CN201710299097 20170428
- Main IPC: H01L21/04
- IPC: H01L21/04 ; H01L29/06 ; H01L21/3115 ; H01L21/28 ; H01L21/74 ; H01L21/266

Abstract:
A semiconductor device and its manufacturing method, relating to semiconductor techniques. The semiconductor device manufacturing method comprises: forming a patterned first hard mask layer on a substrate to define a position for buried layers; conducting a first ion implantation using the first hard mask layer as a mask to form a first buried layer and a second buried layer both having a first conductive type and separated from each other at two sides of the first hard mask layer in the substrate; conducting a second ion implantation to form a separation region with a second conductive type opposite to the first conductive type in the substrate between the first and the second buried layers; removing the first hard mask layer; and forming a semiconductor layer on the substrate. This inventive concept reduces an area budget of a substrate and simplifies the manufacturing process.
Public/Granted literature
- US20180315603A1 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF Public/Granted day:2018-11-01
Information query
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