Invention Grant
- Patent Title: Methods to fill high aspect ratio features on semiconductor substrates with MOCVD cobalt film
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Application No.: US15823422Application Date: 2017-11-27
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Publication No.: US10600685B2Publication Date: 2020-03-24
- Inventor: Daping Yao , Jiang Lu , Can Xu , Paul F. Ma , Mei Chang
- Applicant: APPLIED MATERIALS, INC.
- Applicant Address: US CA Santa Clara
- Assignee: APPLIED MATERIALS, INC.
- Current Assignee: APPLIED MATERIALS, INC.
- Current Assignee Address: US CA Santa Clara
- Agency: Moser Taboada
- Agent Alan Taboada
- Main IPC: H01L21/44
- IPC: H01L21/44 ; H01L21/768 ; H01L23/532 ; H01L21/285

Abstract:
In some embodiments, a method of forming a cobalt layer on a substrate disposed in a process chamber, includes: (a) exposing the substrate to a first process gas comprising a cobalt precursor and a hydrogen containing gas to grow a smooth cobalt layer on a first surface of the substrate and on sidewalls and a bottom surface of a feature formed in the first surface of the substrate; (b) purging the first process gas from the process chamber; and (c) annealing the substrate in a hydrogen atmosphere to fill in voids within the cobalt layer to form a void-free cobalt layer. In some embodiments, plasma treating the substrate in gas under low pressure and/or thermally baking the substrate in gas in an atmosphere under a low pressure, may be performed prior to anneal.
Public/Granted literature
- US20180151424A1 METHODS TO FILL HIGH ASPECT RATIO FEATURES ON SEMICONDUCTOR SUBSTRATES WITH MOCVD COBALT FILM Public/Granted day:2018-05-31
Information query
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