Invention Grant
- Patent Title: Measurements exchange network, such as for internet-of-things (IoT) devices
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Application No.: US15846007Application Date: 2017-12-18
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Publication No.: US10601898B2Publication Date: 2020-03-24
- Inventor: Oleg Pogorelik , Alex Nayshtut , Igor Tatourian , Omer Ben-Shalom
- Applicant: Intel Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H04L29/08
- IPC: H04L29/08 ; H04L12/18 ; H04W4/38 ; G06F17/18 ; G06F3/14

Abstract:
Measurement exchange networks and protocols to exchange measurements of a parameter amongst devices (e.g., IoT devices), select the best measurement(s), accuracy/precision-wise, and determine a process variable for a control system based on the selected best measurement(s). A device may select a peer-provided best measurement to output as the process variable in place of a local measurement, and/or compute the process variable from multiple best measurements (e.g., local and/or peer-provided measurements). Metadata may be used to select a measurement(s) and/or to increase reliability/trust of exchanged data. In this way, each device of an exchange group/network may obtain the highest measurement accuracy of all available collocated sensors with little or no additional processing or cloud connectivity. A best measurement(s) may be selected based on measurement quality specifications extracted from metadata, measurement qualities computed from measurements of respective sensors, locations/proximities of the sensors, a policy(ies), and/or device IDs (e.g., extracted from metadata).
Public/Granted literature
- US20180205783A1 MEASUREMENTS EXCHANGE NETWORK, SUCH AS FOR INTERNET-OF-THINGS (IoT) DEVICES Public/Granted day:2018-07-19
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