Invention Grant
- Patent Title: One measurement gap in asynchronous dual connectivity
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Application No.: US15324246Application Date: 2015-05-27
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Publication No.: US10602511B2Publication Date: 2020-03-24
- Inventor: Rui Huang , Yang Tang , Candy Yiu , Yujian Zhang
- Applicant: Intel IP Corporation
- Applicant Address: US CA Santa Clara
- Assignee: Intel IP Corporation
- Current Assignee: Intel IP Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- International Application: PCT/US2015/032731 WO 20150527
- International Announcement: WO2016/022196 WO 20160211
- Main IPC: H04W72/04
- IPC: H04W72/04 ; H04W24/02 ; H04W16/32 ; H04W16/12 ; H04W88/06

Abstract:
In an embodiment, an apparatus to be employed in a user equipment (UE) is described. The apparatus includes configuration circuitry operable to determine, based on one or more configuration information messages, a measurement gap for a master evolved Node B (MeNB) that is operable to provide a master cell group (MCG) that is asynchronous with a secondary cell group (SCG) of a secondary evolved Node B (SeNB), wherein subframe boundaries of the MCG are different from subframe boundaries of the SCG; and radio frequency (RF) control circuitry operable to cause RF circuitry to be tuned, at a beginning of the measurement gap based on a subframe boundary of the MCG, to start inter-frequency measurements, wherein the RF circuitry is to be used to transmit or receive data in a serving cell of the MCG and in a serving cell of the SCG. Other embodiments are also described and claimed.
Public/Granted literature
- US20170201987A1 ONE MEASUREMENT GAP IN ASYNCHRONOUS DUAL CONNECTIVITY Public/Granted day:2017-07-13
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