Invention Grant
- Patent Title: Object inspection system and object inspection method
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Application No.: US16212689Application Date: 2018-12-07
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Publication No.: US10607337B2Publication Date: 2020-03-31
- Inventor: Junichirou Yoshida , Fumikazu Warashina
- Applicant: FANUC CORPORATION
- Applicant Address: JP Yamanashi
- Assignee: FANUC CORPORATION
- Current Assignee: FANUC CORPORATION
- Current Assignee Address: JP Yamanashi
- Agency: Hauptman Ham, LLP
- Priority: JP2017-245290 20171221
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/73 ; G06T7/33

Abstract:
An object inspection system enabling a quick and easy registering of a master image and an inspection image when there is a displacement between the master image and the inspection image. The object inspection system includes an imaging section, a movement machine configured to move a first object or a second object and an imaging section relative to each other, a positional data acquisition section configured to acquire positional data of the movement machine when the movement machine disposes the first object or the second object and the imaging section at a relative position, an image data acquisition section configured to acquire a first image of the first object and a second image of the second object, and an image registering section configured to register the first image and the second image.
Public/Granted literature
- US20190197676A1 OBJECT INSPECTION SYSTEM AND OBJECT INSPECTION METHOD Public/Granted day:2019-06-27
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