Invention Grant
- Patent Title: Analysis of material layers on surfaces, and related systems and methods
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Application No.: US15954923Application Date: 2018-04-17
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Publication No.: US10608182B2Publication Date: 2020-03-31
- Inventor: Doris Pik-Yiu Chun , Ian David Parker
- Applicant: Kateeva, Inc.
- Applicant Address: US CA Newark
- Assignee: Kateeva, Inc.
- Current Assignee: Kateeva, Inc.
- Current Assignee Address: US CA Newark
- Agent Paula J. Tostado
- Main IPC: G06T11/60
- IPC: G06T11/60 ; H01L51/00 ; H01L51/52 ; G06T7/00 ; G06T11/00 ; G06T11/20

Abstract:
A method of analyzing film on a substrate may comprise receiving three-dimensional data obtained from measurements of a plurality of pixels on a substrate, the plurality of pixels comprising one or more film layers; extracting a plurality of parameters based on the received three-dimensional data, the plurality of parameters comprising at least an average thickness for the film layers of the pixels, one or more area aperture ratios for the film layers of the pixels, and a pitch between pixels, wherein the extraction is based on a predetermined pattern for the pixels on the substrate; displaying a user interface comprising a graphical representation of one or more of the parameters for the one or more film layers of the one or more of the pixels; and dynamically modifying the graphical representation of the one or more parameters in response to user input of the displayed user interface, the dynamically modifying causing the displayed graphical images to appear as continuously changing.
Public/Granted literature
- US20180309061A1 Analysis of Material Layers on Surfaces, and Related Systems and Methods Public/Granted day:2018-10-25
Information query