Invention Grant
- Patent Title: Beam-based measurement configuration
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Application No.: US15972026Application Date: 2018-05-04
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Publication No.: US10609611B2Publication Date: 2020-03-31
- Inventor: Kyungmin Park , Esmael Dinan , Alireza Babaei , Hyoungsuk Jeon
- Applicant: Ofinno Technologies, LLC
- Applicant Address: US VA Reston
- Assignee: Ofinno, LLP
- Current Assignee: Ofinno, LLP
- Current Assignee Address: US VA Reston
- Agent David Grossman; Kavon Nasabzadeh; Philip Smith
- Main IPC: G06F11/00
- IPC: G06F11/00 ; H04W36/08 ; H04W36/00 ; H04B17/309 ; H04W16/28 ; H04W36/30 ; H04W76/19 ; H04W76/18 ; H04W76/27 ; H04W24/10

Abstract:
A wireless device may receive from a first base station, measurement configuration parameters of a measurement of the wireless device. The measurement configuration parameters comprise first beam identifiers of a first plurality of beams, second beam identifiers of a second plurality of beams and a measurement event indicating that a second combined reference signal measurement value of the second plurality of beams exceeds a first combined reference signal measurement value of the first plurality of beams by more than a first offset value. The first plurality of beams and the second plurality of beams are monitored to determine an occurrence of the measurement event. The first base station transmits a measurement report in response to the occurrence of the first measurement event. The measurement report comprises: the first combined reference signal measurement value and the second combined reference signal measurement value.
Public/Granted literature
- US20190132066A1 Beam-Based Measurement Configuration Public/Granted day:2019-05-02
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