Invention Grant
- Patent Title: Conformance test artifact for coordinate measuring machine
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Application No.: US15692570Application Date: 2017-08-31
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Publication No.: US10648791B2Publication Date: 2020-05-12
- Inventor: Charles Salvatore Lamendola
- Applicant: Hexagon Metrology, Inc.
- Applicant Address: US RI North Kingstown
- Assignee: Hexagon Metrology, Inc.
- Current Assignee: Hexagon Metrology, Inc.
- Current Assignee Address: US RI North Kingstown
- Agency: Nutter McClennen & Fish LLP
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B11/25 ; G01B21/04 ; G01B11/02

Abstract:
A test artifact for a coordinate measuring machine includes a calibrated standard and a convex background illumination surface. The calibrated standard, the convex background illumination surface and a vision sensor are positionable relative to one another so as to create a silhouette of the calibrated sphere in the vision sensor's field of view. The test artifact may thus be used to calibrate the coordinate measuring machine, and/or to assess the associativity between the vision sensor and another measuring sensor.
Public/Granted literature
- US20180058840A1 Conformance Test Artifact for Coordinate Measuring Machine Public/Granted day:2018-03-01
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