- Patent Title: Contamination and defect resistant rotary optical encoder configuration including a rotary scale with yawed scale grating bars and structured illumination generating arrangement with a beam deflector configuration
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Application No.: US16413521Application Date: 2019-05-15
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Publication No.: US10648838B2Publication Date: 2020-05-12
- Inventor: Joseph Daniel Tobiason
- Applicant: Mitutoyo Corporation
- Applicant Address: JP Kanagawa-ken
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kanagawa-ken
- Agency: Seed IP Law Group LLP
- Main IPC: G01D5/38
- IPC: G01D5/38 ; G01D5/347

Abstract:
An optical encoder configuration comprises a cylindrical or planar rotary scale including yawed grating bars, an illumination source, a structured illumination generating arrangement (SIGA) and a detector arrangement including a photodetector. The SIGA is configured to input source light to a first illumination region on the rotary scale which diffracts light to a beam deflector configuration which transmits the diffracted light in a form that provides a particular fringe pattern proximate to a second illumination region on the scale. The scale filters and outputs that light to form a detector fringe pattern of intensity bands that are long along the rotary measuring direction and relatively narrow and periodic along a detected fringe motion direction (DFMD) transverse to the rotary measuring direction. The photodetector is configured to detect a position of the intensity bands as a function of rotary scale displacement and provide corresponding displacement or position signals.
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