- Patent Title: System and method for analyzing dusty industrial off-gas chemistry
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Application No.: US16178625Application Date: 2018-11-02
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Publication No.: US10648901B2Publication Date: 2020-05-12
- Inventor: Vittorio Scipolo , Douglas J. Zuliani , Avishekh Pal , Ovidiu Negru
- Applicant: TENOVA GOODFELLOW INC.
- Main IPC: G01N21/03
- IPC: G01N21/03 ; G01N21/39 ; G01N33/00 ; G01N21/05 ; G01N21/25

Abstract:
An off-gas analyzer for analyzing H2O vapor, CO, O2, CO2 and/or H2 in a furnace gas stream is fluidically coupled to a gas extraction probe. The analyzer includes an optical measurement cell having multiple sampling chambers, optically coupled to a laser. The analyzer measuring cell is housed within a heated cabinet having a heater operable to heat the interior thereof so as to maintain the extracted gas sample therein at a temperature about the condensation point of water. The analyzer allows for the analysis of the gas water vapour of wet off-gas samples.
Public/Granted literature
- US20190226980A1 System and Method for Analyzing Dusty Industrial Off-gas Chemistry Public/Granted day:2019-07-25
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