Invention Grant
- Patent Title: Optical sample detection system
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Application No.: US15773910Application Date: 2016-10-25
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Publication No.: US10648914B2Publication Date: 2020-05-12
- Inventor: Fumio Nagai , Tetsuya Noda
- Applicant: KONICA MINOLTA, INC
- Applicant Address: JP Tokyo
- Assignee: Konica Minolta, Inc.
- Current Assignee: Konica Minolta, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Cozen O'Connor
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@728f9801
- International Application: PCT/JP2016/081592 WO 20161025
- International Announcement: WO2017/082043 WO 20170518
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B5/04 ; G01N21/552

Abstract:
An optical sample detection system includes: a sensor chip including a dielectric member, a metal film adjacent to an upper surface of the dielectric member, a reaction layer adjacent to an upper surface of the metal film, and a lid member disposed on an upper surface of the reaction layer; a chip holding unit for holding the sensor chip; and a light projecting unit that irradiates the metal film with excitation light through the dielectric member. A sample is detected by irradiating the metal film with excitation light through the dielectric member. The lid member is wider than the dielectric member in an optical path cross section of the excitation light.
Public/Granted literature
- US20180321152A1 Optical Sample Detection System Public/Granted day:2018-11-08
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