Invention Grant
- Patent Title: Image inspection apparatus, image inspection method, image inspection program, computer-readable recording medium and recording device
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Application No.: US16166694Application Date: 2018-10-22
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Publication No.: US10648921B2Publication Date: 2020-05-12
- Inventor: Zhuoli Sun
- Applicant: Keyence Corporation
- Applicant Address: JP Osaka
- Assignee: Keyence Corporation
- Current Assignee: Keyence Corporation
- Current Assignee Address: JP Osaka
- Agency: Kilyk & Bowersox, P.L.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4f237737
- Main IPC: G01N21/88
- IPC: G01N21/88 ; H04N13/207 ; G06T7/586 ; G01B11/24 ; G06T7/00 ; H04N13/254

Abstract:
An image inspection apparatus includes: an imaging section for capturing an image of a workpiece from a certain direction; an illumination section for illuminating the workpiece from different directions at least three times; an illumination controlling section for sequentially turning on the illumination sections one by one; an imaging generating section for driving the imaging section to generate a plurality of images; a normal vector calculating section for calculating a normal vector with respect to the surface of the workpiece at each of pixels by use of a pixel value of each of pixels having a corresponding relation among the plurality of images; and a contour image generating section for performing differential processing in an X-direction and a Y-direction on the calculated normal vector at each of the pixels, to generate a contour image that shows a contour of inclination of the surface of the workpiece.
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