Invention Grant
- Patent Title: Crack analysis device, crack analysis method, and crack analysis program
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Application No.: US15745646Application Date: 2016-07-21
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Publication No.: US10648922B2Publication Date: 2020-05-12
- Inventor: Yoko Yonekawa , Nobuyuki Kumakura , Takahiko Yamazaki , Shingo Yasunami
- Applicant: Kabushiki Kaisha Toshiba , Toshiba Infrastructure Systems & Solutions Corporation
- Applicant Address: JP Tokyo JP Kawasaki-shi, Kanagawa
- Assignee: Kabushiki Kaisha Toshiba,Toshiba Infrastructure Systems & Solutions Corporation
- Current Assignee: Kabushiki Kaisha Toshiba,Toshiba Infrastructure Systems & Solutions Corporation
- Current Assignee Address: JP Tokyo JP Kawasaki-shi, Kanagawa
- Agency: Baker Botts L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@20f69736 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2afd80c8
- International Application: PCT/JP2016/071455 WO 20160721
- International Announcement: WO2017/014288 WO 20170126
- Main IPC: G01N21/88
- IPC: G01N21/88 ; E01C23/01 ; G01B11/30 ; G01N21/95
Abstract:
A crack analysis device includes a captured image acquiring unit, a crack detecting unit, and a crack ratio calculator. The captured image acquiring unit acquires a captured image which is obtained by imaging a road surface. The crack detecting unit detects cracks in the imaged road surface on the basis of the captured image. The crack ratio calculator calculates a crack ratio indicating a ratio of an area of the cracks to a predetermined area on the basis of the detected cracks.
Public/Granted literature
- US20180195973A1 CRACK ANALYSIS DEVICE, CRACK ANALYSIS METHOD, AND CRACK ANALYSIS PROGRAM Public/Granted day:2018-07-12
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