Invention Grant
- Patent Title: Method of detecting particles on panel
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Application No.: US16338336Application Date: 2017-09-26
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Publication No.: US10648926B2Publication Date: 2020-05-12
- Inventor: Xueshan Han , Yongqiang Shen
- Applicant: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Applicant Address: CN Shanghai
- Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Current Assignee: SHANGHAI MICRO ELECTRONICS EQUIPMENT (GROUP) CO., LTD.
- Current Assignee Address: CN Shanghai
- Agency: Muncy, Geissler, Olds & Lowe, PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6d8fac53
- International Application: PCT/CN2017/103334 WO 20170926
- International Announcement: WO2018/059376 WO 20180405
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/94 ; G01N21/95 ; G01N21/956 ; G01N15/02 ; G03F7/20

Abstract:
A method for detecting degree of particulate contamination on a flat panel mainly includes the following steps: illuminating a to-be-detected flat panel (40) by using a light source module (10), to form an illumination field; adjusting a half width of the illumination field; adjusting a luminous intensity at a center of the illumination field and a luminous intensity at an edge of the half width of the illumination field; adjusting a light intensity and a position of the light source, as well as a position of a detector (20); and acquiring signals from foreign objects on the flat panel by using the detector (20). This method greatly alleviates particle mirror crosstalk and crosstalk of patterns on the lower surface of the flat panel, and improves the SNR, thus enhancing the accuracy in detection of foreign objects on the flat panel.
Public/Granted literature
- US20200025691A1 METHOD OF DETECTING PARTICLES ON PANEL Public/Granted day:2020-01-23
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