Invention Grant
- Patent Title: Systems, apparatuses, and methods for optical focusing in scattering samples
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Application No.: US16250524Application Date: 2019-01-17
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Publication No.: US10648934B2Publication Date: 2020-05-12
- Inventor: Donggyu Kim , Dirk Robert Englund
- Applicant: Donggyu Kim , Dirk Robert Englund
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Smith Baluch LLP
- Main IPC: G01V3/00
- IPC: G01V3/00 ; G01N24/00 ; G01Q60/20 ; G02B7/04 ; G01R33/32 ; G01N24/10

Abstract:
A method includes applying, to a sample exhibiting optical scattering and having a emission particles distributed therein that exhibit spin-dependent fluorescence, a magnetic field to shift a resonance frequency of each emission particle in a position-dependent manner. The method also includes exciting the sample with an excitation beam that causes at least one emission particle to emit spin-dependent fluorescence and detecting the emitted spin-dependent fluorescence. The method also includes estimating a position of the emission particle(s) within the sample based on the spin-dependent fluorescence, the resonance frequency, and the magnetic field. The method also includes estimating optical transmission information for the sample based on a wavefront of the excitation beam and the estimated position. The optical transmission information including a measure of an optical field at each position of an emission particle.
Public/Granted literature
- US20190219527A1 SYSTEMS, APPARATUSES, AND METHODS FOR OPTICAL FOCUSING IN SCATTERING SAMPLES Public/Granted day:2019-07-18
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