Invention Grant
- Patent Title: Specimen measurement apparatus and specimen aspiration method
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Application No.: US15854999Application Date: 2017-12-27
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Publication No.: US10648996B2Publication Date: 2020-05-12
- Inventor: Toru Mizuhashi , Hiroaki Tobimatsu , Tomoya Hayashi
- Applicant: SYSMEX CORPORATION
- Applicant Address: JP Kobe-shi
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Kobe-shi
- Agency: Metrolex IP Law Group, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@55667c5a
- Main IPC: G01N35/10
- IPC: G01N35/10 ; G01N15/14 ; G01N35/00 ; G01N15/00 ; G01N15/10
Abstract:
A specimen measurement apparatus may include: an aspirator via which a specimen is aspirated. A flow path may be connected to the aspirator. A first pump may be connected to the flow path. A second pump may be connected to the flow path. A controller may select and cause either the first pump or the second pump to aspirate the specimen via the aspirator.
Public/Granted literature
- US20180180638A1 SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN ASPIRATION METHOD Public/Granted day:2018-06-28
Information query
