Invention Grant
- Patent Title: Optically probed multi-element electric field sensing system
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Application No.: US15694739Application Date: 2017-09-01
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Publication No.: US10649019B2Publication Date: 2020-05-12
- Inventor: Martin Friedrich Schubert , Michael Jason Grundmann
- Applicant: X Development LLC
- Applicant Address: US CA Mountain View
- Assignee: X Development LLC
- Current Assignee: X Development LLC
- Current Assignee Address: US CA Mountain View
- Agency: Fish & Richardson P.C.
- Main IPC: G01R29/08
- IPC: G01R29/08 ; A61B5/0476 ; A61B5/00 ; A61B5/1495 ; A61B5/1455 ; A61B5/0478

Abstract:
A system and a method for determining local electric field strengths, the system including: a light source module configured to emit light; a plurality of electric field sensors, each sensor including a light input portion and a light output portion, each sensor including an electro-optic material arranged in a path of at least some of the received light, an optical property of the electro-optic material being variable depending on a local electric field strength at the sensor, and the electro-optic material being arranged in the sensor such that a property of the output light varies depending on the local electric field strength; a light detection module arranged to receive the output light from the sensors; and a processing module in communication with the light detection module, the processing module being programmed to determine a corresponding value for the electric field strength local to each of the sensors.
Public/Granted literature
- US20190072599A1 Optically Probed Multi-Element Electric Field Sensing System Public/Granted day:2019-03-07
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