Invention Grant
- Patent Title: Electronics tester
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Application No.: US15906620Application Date: 2018-02-27
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Publication No.: US10649022B2Publication Date: 2020-05-12
- Inventor: Jovan Jovanovic , Kenneth W. Deboe , Steven C. Steps , Scott E. Lindsey
- Applicant: AEHR TEST SYSTEMS
- Applicant Address: US CA Fremont
- Assignee: AEHR TEST SYSTEMS
- Current Assignee: AEHR TEST SYSTEMS
- Current Assignee Address: US CA Fremont
- Agent Stephen M. De Klerk
- Main IPC: G01R31/20
- IPC: G01R31/20 ; G01R31/28 ; H01L21/687 ; H05K7/14

Abstract:
A tester apparatus is described. Various components contribute to the functionality of the tester apparatus, including an insertion and removal apparatus, thermal posts, independent gimbaling, the inclusion of a photo detector, a combination of thermal control methods, a detect circuitry in a socket lid, through posts with stand-offs, and a voltage retargeting.
Public/Granted literature
- US20180252762A1 ELECTRONICS TESTER Public/Granted day:2018-09-06
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