Invention Grant
- Patent Title: Single layer sensor array scan
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Application No.: US16172783Application Date: 2018-10-27
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Publication No.: US10649600B1Publication Date: 2020-05-12
- Inventor: Tetsuo Tanemura
- Applicant: SYNAPTICS INCORPORATED
- Applicant Address: US CA San Jose
- Assignee: SYNAPTICS INCORPORATED
- Current Assignee: SYNAPTICS INCORPORATED
- Current Assignee Address: US CA San Jose
- Agency: Patterson + Sheridan, LLP
- Main IPC: G06F3/044
- IPC: G06F3/044 ; G06F3/041

Abstract:
A method of performing a scan of a sensor array is disclosed, as well as an associated processing system and input device. The sensor array comprises a plurality of sensor electrodes in a single layer. A plurality of routing traces is arranged in the single layer. The method comprises, for each sensor electrode of the plurality of sensor electrodes, acquiring, during a first period, an absolute capacitive measurement for the sensor electrode. The method further comprises, for each bordering sensor electrode of one or more bordering sensor electrodes of the plurality of sensor electrodes, acquiring, during a second period, a transcapacitive measurement between the sensor electrode and the bordering sensor electrode.
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