Disclosed herein are methods, systems, and processes to generate and perform parallelizable data-driven single instruction multiple data (SIMD) tests. A base abstract class that defines shared testing parameters for tests to be performed on an application is designated. Inheriting classes of the base abstract class are defined and a data source key is derived from the inhering classes. A test data source is accessed to perform the tests on the application and a result of tests is generated based on the data source key.