Generating reports for critical path evaluation and tuning. A predetermined critical path in a circuit design is detected. The predetermined critical path includes a plurality of interconnects between at least two macros. At least one output or at least one input is detected for each of the at least two macros associated with the predetermined critical path. Additionally, a routing description and a buffer location corresponding to the predetermined critical path are detected and a reduced layout design is built. The reduced layout design includes the predetermined critical path and the at least two macros. Furthermore, a timing report is generated based on the reduced layout design, and a circuit based on the circuit design is manufactured in response to detecting the timing report based on the reduced layout design satisfies a predetermined condition.