- Patent Title: Systems and methods to determine motion parameters using RFID tags
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Application No.: US16405946Application Date: 2019-05-07
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Publication No.: US10650200B2Publication Date: 2020-05-12
- Inventor: John R. Tuttle
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Greenberg Traurig
- Main IPC: G06K7/10
- IPC: G06K7/10 ; G01S11/10 ; G01S13/75 ; G06K7/00
Abstract:
Systems and methods to determine motion parameters of physical objects using radio frequency identification (RFID) tags attached to the objects. In one embodiment, a method implemented in a radio frequency identification (RFID) system includes determining a motion parameter of the RFID tag based on detecting a Doppler frequency shift in a radio frequency signal received from the RFID tag.
Public/Granted literature
- US20190266366A1 Systems and Methods to Determine Motion Parameters using RFID Tags Public/Granted day:2019-08-29
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