An electrical storage capacitor provides a primary electrode is in electrical communication with a primary conducting layer having thickness in the range of 20 nm to 100 micron, a secondary electrode is in electrical communication with a secondary conducting layer having thickness in the range of 20 nm to 1 micron, a high energy density dielectric layer having relative dielectric permittivity greater than εR≥70 and thickness less than 1 micron that is formed between the primary electrode and the secondary electrode, wherein the high energy density dielectric has a dielectric polarization response that is determined solely by orbital deformations of the atomic species forming said high energy density dielectric.