Invention Grant
- Patent Title: Method of forming a semiconductor device having through silicon vias
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Application No.: US16295380Application Date: 2019-03-07
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Publication No.: US10651158B2Publication Date: 2020-05-12
- Inventor: Ryohei Kitada , Masahiro Yamaguchi
- Applicant: Longitude Licensing Limited
- Applicant Address: IE Dublin
- Assignee: Longitude Licensing Limited
- Current Assignee: Longitude Licensing Limited
- Current Assignee Address: IE Dublin
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@75555eb
- Main IPC: H01L25/065
- IPC: H01L25/065 ; H01L23/29 ; H01L23/31 ; H01L23/48 ; H01L23/498 ; H01L23/522 ; H01L23/00 ; H01L25/00 ; H01L21/768 ; H01L21/683

Abstract:
In the semiconductor device, a semiconductor substrate has first and second surfaces. A circuitry layer is formed over the first surface and a first insulating layer is further formed over the circuitry layer. A second insulating layer including a first insulating element is formed over the second surface. A third insulating layer including a second insulating element different from the first insulating element of the second insulating layer is formed over the second surface with an intervention of the second insulating layer therebetween. A penetration electrode penetrates through the semiconductor substrate, the circuitry layer, the first insulating layer, the second insulating layer and the third insulating layer.
Public/Granted literature
- US20190206842A1 Semiconductor Device Having Through Silicon Vias Public/Granted day:2019-07-04
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