• Patent Title: Throughput measuring apparatus, method, and recording medium
  • Application No.: US15768067
    Application Date: 2016-11-01
  • Publication No.: US10652123B2
    Publication Date: 2020-05-12
  • Inventor: Natsuki Kai
  • Applicant: NEC Corporation
  • Applicant Address: JP Tokyo
  • Assignee: NEC CORPORATION
  • Current Assignee: NEC CORPORATION
  • Current Assignee Address: JP Tokyo
  • Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@6b9885c2
  • International Application: PCT/JP2016/004780 WO 20161101
  • International Announcement: WO2017/077704 WO 20170511
  • Main IPC: H04L12/26
  • IPC: H04L12/26
Throughput measuring apparatus, method, and recording medium
Abstract:
In order to enable to measure a throughput with high accuracy in an application layer, a throughput measuring method according to an exemplary aspect of the invention includes: transmitting data to a receiving device, receiving a feedback indicating a receiving completion of the data, from the receiving device, calculating a boundary value of a range of values allowable for a throughput, based on the feedback and a transmitted data amount of the data, measuring a theoretical value of the throughput, and outputting the boundary value when the theoretical value falls outside the range, and outputting the theoretical value when the theoretical value falls within the range.
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