Invention Grant
- Patent Title: X-ray phase imaging apparatus
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Application No.: US15704345Application Date: 2017-09-14
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Publication No.: US10656103B2Publication Date: 2020-05-19
- Inventor: Satoshi Sano , Taro Shirai , Takahiro Doki , Akira Horiba
- Applicant: Shimadzu Corporation
- Applicant Address: JP Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto
- Agency: Muir Patent Law, PLLC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1d4a7f22
- Main IPC: G01N23/046
- IPC: G01N23/046 ; G21K1/06 ; G01N23/207 ; G01N23/041 ; A61B6/00

Abstract:
The X-ray phase imaging apparatus is configured to include an image generation unit that generates an X-ray phase-contrast image based on a phase-contrast between a step curve representing an intensity change of an X-ray when an object is placed between an X-ray source and a phase grating or between a phase grating and an absorption grating and a step curve when no object is placed therebetween, and is configured to obtain a displacement amount of relative positions of a plurality of gratings based on a plurality of step curves.
Public/Granted literature
- US20180172607A1 X-RAY PHASE IMAGING APPARATUS Public/Granted day:2018-06-21
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