Invention Grant
- Patent Title: Multi-function electronic device testing
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Application No.: US15595312Application Date: 2017-05-15
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Publication No.: US10656206B1Publication Date: 2020-05-19
- Inventor: Prashanth Basavaraj Patil , San-Ching De La Cruz
- Applicant: Amazon Technologies, Inc.
- Applicant Address: US WA Seattle
- Assignee: Amazon Technologies, Inc.
- Current Assignee: Amazon Technologies, Inc.
- Current Assignee Address: US WA Seattle
- Agency: Lee & Hayes, P.C.
- Main IPC: G06Q10/08
- IPC: G06Q10/08 ; G01R31/319 ; G01R31/01 ; G01R31/28

Abstract:
A multi-function test machine includes a table assembly, a robotic arm, one or more stimulators, one or more sensors, and a computing device for testing electronic devices. The multi-function tester may also include a camera test assembly and a universal device holder. The multi-function tester is capable of testing multiple systems of an electronic device concurrently, thus obviating the need for multiple test stations and operators.
Information query