Invention Grant
- Patent Title: Inspection apparatus, inspection method and storage medium
-
Application No.: US15920494Application Date: 2018-03-14
-
Publication No.: US10657635B2Publication Date: 2020-05-19
- Inventor: Hitomi Kaneko
- Applicant: Hitomi Kaneko
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@72f3531a com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1fce8d62
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/13 ; G06T7/174

Abstract:
An inspection apparatus includes circuitry to acquire a reference image used for inspecting a printed matter, acquire a scanned image by scanning the printed matter, generate a difference image indicating a difference between the acquired reference image and the acquired scanned image, extract an edge region from the reference image, detect a proximity region located near the edge region, correct an inspection threshold to be applied to a pixel defining the edge region based on a density difference and a distance between the pixel defining the edge region and an influencing pixel set the proximity region, and an inspection threshold to be applied to a pixel defining the proximity region based on a density difference and a distance between the pixel defining the proximity region and an influencing pixel in the edge region, and inspect the printed matter based on the generated difference image and the corrected inspection threshold.
Public/Granted literature
- US20180268534A1 INSPECTION APPARATUS, INSPECTION METHOD AND STORAGE MEDIUM Public/Granted day:2018-09-20
Information query