Invention Grant
- Patent Title: System and method for generating images for inspection
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Application No.: US16382560Application Date: 2019-04-12
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Publication No.: US10657640B2Publication Date: 2020-05-19
- Inventor: Maya Dekel-Klein , Chanan Gazala
- Applicant: Advanced Vision Technology (A.V.T.) Ltd.
- Applicant Address: IL Hod Hashron
- Assignee: Advanced Vision Technology (A.V.T.) Ltd.
- Current Assignee: Advanced Vision Technology (A.V.T.) Ltd.
- Current Assignee Address: IL Hod Hashron
- Agency: RatnerPrestia
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@47d760b6
- Main IPC: G06T7/00
- IPC: G06T7/00 ; B41F33/00 ; G06K15/02 ; G06K9/62 ; G06N3/04 ; G06N3/08 ; G06T7/73

Abstract:
Method for generating a test-set for inspection of a design being printed by a printing-press, each color-unit in the printing-press prints a respective color. The design is composed of original-layers. Inspection includes determining the origin of at least one defect in the printed-design. The method includes the procedures of generating defective-layer or layers of the design, by introducing at least one selected defect to at least one selected original-layer, in a selected location or locations and combining layers using a trained-synthesis-neural-network. The layers include the defective-layer or layers and remaining ones of the original-layers. The trained-synthesis-neural-network provides a plurality of features respective of each pixel. The method also includes the procedure of generating the test-set from the output of the synthesis-neural-network. The test-set includes at least one synthesized-test-image. The synthesized-test-image includes at least one synthesized-defect at the selected location. The test-set is employed to determine the origin of the defect.
Public/Granted literature
- US20190304085A1 SYSTEM AND METHOD FOR GENERATING IMAGES FOR INSPECTION Public/Granted day:2019-10-03
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