A semiconductor memory device of one embodiment includes a p-type first semiconductor region, n word lines from the first to nth word lines stacked on the first semiconductor region in a first direction, an n-type second semiconductor region, a semiconductor layer between the first semiconductor region and the second semiconductor region, extending in the first direction, and intersecting with the n word lines, and a control circuit which, when verifying whether or not a kth memory cell provided in a region where a kth (4