Exemplary methods, apparatuses, and systems include a controller that determines that a group of memory cells of a first memory device has an elevated error rate. In response to determining the elevated error rate, the controller identifies a spare group of memory cells. The group of memory cells and the spare group of memory cells span a first dimension and a second dimension that is orthogonal to the first dimension. The controller reads a portion of a logical unit from the group of memory cells along the first dimension of the group. The controller further determines that the group of memory cells and the spare group of memory cells have strong disturb effects in different dimensions and, in response to that determination, writes the portion of the logical unit to the spare group of memory cells along the second dimension of the spare group.