Invention Grant
- Patent Title: Circuit delay self-measurement method, device and system
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Application No.: US16346530Application Date: 2017-09-01
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Publication No.: US10659180B2Publication Date: 2020-05-19
- Inventor: Dongsheng Li
- Applicant: TENDYRON CORPORATION
- Applicant Address: CN Beijing
- Assignee: TENDYRON CORPORATION
- Current Assignee: TENDYRON CORPORATION
- Current Assignee Address: CN Beijing
- Agency: BakerHostetler
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@c998aa2 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@9ee5f3f
- International Application: PCT/CN2017/100212 WO 20170901
- International Announcement: WO2018/082391 WO 20180511
- Main IPC: H04B17/364
- IPC: H04B17/364

Abstract:
The present disclosure provides a circuit delay self-measurement method, device and system. The device includes: a first communication interface, configured to receive a first analog signal; a receiving circuit module, configured to perform a first processing on the first analog signal to generate a first digital signal; a main control chip, configured to generate a second analog signal; a first switch module, configured to turn off a path between the first stationary end and the first connection end and turn on a path between the first stationary end and the second connection end; the main control chip is configured to send the second analog signal to the receiving circuit module; the receiving circuit module is configured to perform the first processing on the second analog signal to generate a second digital signal; the main control chip is configured to determine the circuit delay of the receiving circuit module.
Public/Granted literature
- US20190305862A1 CIRCUIT DELAY SELF-MEASUREMENT METHOD, DEVICE AND SYSTEM Public/Granted day:2019-10-03
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