• Patent Title: Circuit delay self-measurement method, device and system
  • Application No.: US16346530
    Application Date: 2017-09-01
  • Publication No.: US10659180B2
    Publication Date: 2020-05-19
  • Inventor: Dongsheng Li
  • Applicant: TENDYRON CORPORATION
  • Applicant Address: CN Beijing
  • Assignee: TENDYRON CORPORATION
  • Current Assignee: TENDYRON CORPORATION
  • Current Assignee Address: CN Beijing
  • Agency: BakerHostetler
  • Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@c998aa2 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@9ee5f3f
  • International Application: PCT/CN2017/100212 WO 20170901
  • International Announcement: WO2018/082391 WO 20180511
  • Main IPC: H04B17/364
  • IPC: H04B17/364
Circuit delay self-measurement method, device and system
Abstract:
The present disclosure provides a circuit delay self-measurement method, device and system. The device includes: a first communication interface, configured to receive a first analog signal; a receiving circuit module, configured to perform a first processing on the first analog signal to generate a first digital signal; a main control chip, configured to generate a second analog signal; a first switch module, configured to turn off a path between the first stationary end and the first connection end and turn on a path between the first stationary end and the second connection end; the main control chip is configured to send the second analog signal to the receiving circuit module; the receiving circuit module is configured to perform the first processing on the second analog signal to generate a second digital signal; the main control chip is configured to determine the circuit delay of the receiving circuit module.
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