Invention Grant
- Patent Title: Method for measuring temperature at each location of pipe in hot water supply system
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Application No.: US15744380Application Date: 2016-08-04
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Publication No.: US10663356B2Publication Date: 2020-05-26
- Inventor: Seung Kil Son , Si Hwan Kim , Chang Heo Heo , Jung Keom Kim , You Bin Lee
- Applicant: KYUNGDONG NAVIEN CO., LTD
- Applicant Address: KR Pyeongtaek-si, Gyeonggi-Do
- Assignee: KYUNGDONG NAVIEN CO., LTD.
- Current Assignee: KYUNGDONG NAVIEN CO., LTD.
- Current Assignee Address: KR Pyeongtaek-si, Gyeonggi-Do
- Agency: Novick, Kim & Lee, PLLC
- Agent Jae Youn Kim
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@49311918
- International Application: PCT/KR2016/008585 WO 20160804
- International Announcement: WO2017/026737 WO 20170216
- Main IPC: G01K13/02
- IPC: G01K13/02 ; G01K7/42 ; F24D17/00 ; F24D19/10 ; G01F1/00

Abstract:
Provided is a method for measuring the temperature at each location of a pipe in a hot water supply system comprising a water heater, a pipe, and outlets, the method comprising checking for a temperature of a first point (TP1), which is upstream of the outlet, a temperature of a second point (TP2), which is downstream of the outlet and an outdoor temperature (TA), and confirming a length (L) of the pipe from the first point to the second point, then measuring a temperature of the pipe located at a distance of x away from the first point.
Public/Granted literature
- US20180202871A1 METHOD FOR MEASURING TEMPERATURE AT EACH LOCATION OF PIPE IN HOT WATER SUPPLY SYSTEM Public/Granted day:2018-07-19
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