Invention Grant
- Patent Title: Testing assembly including a multiple degree of freedom stage
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Application No.: US15295196Application Date: 2016-10-17
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Publication No.: US10663380B2Publication Date: 2020-05-26
- Inventor: Edward Cyrankowski , Syed Amanulla Syed Asif , Ryan Major , Derek Rasugu , Yuxin Feng
- Applicant: Bruker Nano, Inc.
- Applicant Address: US CA Santa Barbara
- Assignee: Bruker Nano, Inc.
- Current Assignee: Bruker Nano, Inc.
- Current Assignee Address: US CA Santa Barbara
- Agency: Schwegman Lundberg & Woessner, P.A.
- Main IPC: G01N3/04
- IPC: G01N3/04 ; G01N3/42 ; G02B21/26 ; G02B21/32 ; G21K5/10 ; H01J37/20

Abstract:
A multiple degree of freedom sample stage or testing assembly including a multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes a plurality of stages including linear, and one or more of rotation or tilt stages configured to position a sample in a plurality of orientations for access or observation by multiple instruments in a clustered volume that confines movement of the multiple degree of freedom sample stage. The multiple degree of freedom sample stage includes one or more clamping assemblies to statically hold the sample in place throughout observation and with the application of force to the sample, for instance by a mechanical testing instrument. Further, the multiple degree of freedom sample stage includes one or more cross roller bearing assemblies that substantially eliminate mechanical tolerance between elements of one or more stages in directions orthogonal to a moving axis of the respective stages.
Public/Granted literature
- US20170030812A1 TESTING ASSEMBLY INCLUDING A MULTIPLE DEGREE OF FREEDOM STAGE Public/Granted day:2017-02-02
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