Invention Grant
- Patent Title: Drop testing apparatus
-
Application No.: US15801870Application Date: 2017-11-02
-
Publication No.: US10663384B2Publication Date: 2020-05-26
- Inventor: Jung Jin Lee , Joong Wook Kim
- Applicant: KOREA AEROSPACE RESEARCH INSTITUTE
- Applicant Address: KR Daejeon
- Assignee: KOREA AEROSPACE RESEARCH INSTITUTE
- Current Assignee: KOREA AEROSPACE RESEARCH INSTITUTE
- Current Assignee Address: KR Daejeon
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2ae2359f
- Main IPC: G01N3/303
- IPC: G01N3/303 ; G01M7/08 ; G01N3/40

Abstract:
A drop testing apparatus is provided. The drop testing apparatus includes a plate connected to an external crane, a magnet holder provided at one end of the plate and fixed to the plate by an electromagnetic force, a counterweight provided at another end of the plate and facing the magnet holder, a dummy structure connected to the magnet holder through a connecting member and having a test specimen installed at one side thereof, a load cell unit provided between the dummy structure and the test specimen to measure impulse of the test specimen, and a controller configured to control the electromagnetic force to be created in the magnet holder and to receive the impulse measured by the load cell unit. When the electromagnetic force is cancelled, the connecting member disengages from the magnet holder, and the dummy structure and the test specimen fall onto the ground.
Public/Granted literature
- US20180120208A1 DROP TESTING APPARATUS Public/Granted day:2018-05-03
Information query