- Patent Title: Measurement apparatus, test method, and physical property evaluation program for indentation creep test, and recording medium recording physical property evaluation program
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Application No.: US15577602Application Date: 2016-06-01
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Publication No.: US10663385B2Publication Date: 2020-05-26
- Inventor: Tatsuya Miyajima
- Applicant: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Applicant Address: JP Tokyo
- Assignee: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee: NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
- Current Assignee Address: JP Tokyo
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2437628f com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4ad50527
- International Application: PCT/JP2016/066309 WO 20160601
- International Announcement: WO2016/194985 WO 20161208
- Main IPC: G01N3/42
- IPC: G01N3/42 ; G01N3/54

Abstract:
A measurement apparatus for carrying out an indentation creep test on a specimen, including a measurement control apparatus that includes a load measurement device, a constant-load compression device configured to compress a tip of a transparent indenter to a surface of the specimen, and an image capturing device configured to optically capture an image including a contact area portion which is a part of the specimen to which the load is applied by the constant-load compression device. The apparatus also includes an information processing apparatus that includes an image analysis unit configured to analyze a contact area, and a physical property value calculation unit. The physical property value calculation unit conducts linear regression with respect to a plot of a logarithmic value of the contact stress and a logarithmic value of the contact strain rate so as to determine a creep index n and creep constant k.
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