Invention Grant
- Patent Title: Inspection devices and methods for inspecting a container
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Application No.: US15865520Application Date: 2018-01-09
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Publication No.: US10663413B2Publication Date: 2020-05-26
- Inventor: Qiang Li , Jianping Gu , Bin Xu , Yaohong Liu , Ziran Zhao
- Applicant: Nuctech Company Limited , Tsinghua University
- Applicant Address: CN Haidian District, Beijing CN Haidian District, Beijing
- Assignee: Nuctech Company Limited,Tsinghua University
- Current Assignee: Nuctech Company Limited,Tsinghua University
- Current Assignee Address: CN Haidian District, Beijing CN Haidian District, Beijing
- Agency: Merchant & Gould P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7418b0
- Main IPC: G01N23/046
- IPC: G01N23/046 ; G01V5/00 ; G01N23/041

Abstract:
A method for inspecting a container and an inspection device are disclosed. X-ray scanning is performed on the inspected container to obtain a scanned image. The scanned image is processed to obtain a region of interest. Features of texture units included in the region of interest are calculated. Local descriptions of the texture units are formed based on the features of the texture units. Distinction of each local point is calculated from a local description of each of the texture units so as to obtain a local distinct map of the region of interest. It is determined whether there is an article which is secretly carried in the inspected container using the local distinct map.
Public/Granted literature
- US20180195979A1 INSPECTION DEVICES AND METHODS FOR INSPECTING A CONTAINER Public/Granted day:2018-07-12
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