Invention Grant
- Patent Title: Method of measuring distribution of binder in electrode
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Application No.: US15744524Application Date: 2016-10-07
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Publication No.: US10663528B2Publication Date: 2020-05-26
- Inventor: Taek Soo Lee , Jung Woo Yoo , Je Young Kim
- Applicant: LG Chem, Ltd.
- Applicant Address: KR
- Assignee: LG Chem, Ltd.
- Current Assignee: LG Chem, Ltd.
- Current Assignee Address: KR
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@4f794e1d
- International Application: PCT/KR2016/011275 WO 20161007
- International Announcement: WO2017/061830 WO 20170413
- Main IPC: G01R31/36
- IPC: G01R31/36 ; G01R31/385 ; H01M4/139 ; H01M4/62 ; H01M10/42 ; H01M4/04 ; H01M10/48 ; H01M4/36 ; H01M4/505 ; H01M4/525 ; H01M10/058 ; H01M10/0525

Abstract:
A method of the present invention includes measuring a thickness of an electrode in which an active material layer is formed on a current collector (Step 1); fixing the active material layer of the electrode to a substrate (Step 2); attaching a removal tape to the current collector of the electrode, and then measuring an adhesive strength of the removal tape and measuring a thickness of the electrode after the removal (Step 3); attaching a removal tape to the active material layer from which the current collector is removed, and then measuring an adhesive strength of the removal tape and measuring the thickness of the electrode after the removal, wherein this procedure is repeated until a measurement limit is reached (Step 4); and determining a distribution of a binder according to the thickness of the electrode from measured values obtained in Steps 3 and 4 (Step 5).
Public/Granted literature
- US20180210034A1 METHOD OF MEASURING DISTRIBUTION OF BINDER IN ELECTRODE Public/Granted day:2018-07-26
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