Invention Grant
- Patent Title: X-ray tomography inspection systems and methods
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Application No.: US15954853Application Date: 2018-04-17
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Publication No.: US10663616B2Publication Date: 2020-05-26
- Inventor: Edward James Morton
- Applicant: Rapiscan Systems, Inc.
- Applicant Address: US CA Torrance
- Assignee: Rapiscan Systems, Inc.
- Current Assignee: Rapiscan Systems, Inc.
- Current Assignee Address: US CA Torrance
- Agency: Novel IP
- Main IPC: G01V5/00
- IPC: G01V5/00 ; H01J35/12 ; H01J35/06 ; H01J35/16

Abstract:
An X-ray inspection system for scanning items is provided. The system includes: a stationary X-ray source extending around a rectangular scanning volume, and defining multiple source points from which X-rays can be directed through the scanning volume; an X-ray detector array also extending around the rectangular scanning volume and arranged to detect X-rays from the source points which have passed through the scanning volume; a conveyor arranged to convey the items through the scanning volume; and at least one processor for processing the detected X-rays to produce scanning images of the items.
Public/Granted literature
- US20180299580A1 X-Ray Tomography Inspection Systems and Methods Public/Granted day:2018-10-18
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