Invention Grant
- Patent Title: Scanning microscope
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Application No.: US15536675Application Date: 2015-12-21
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Publication No.: US10663707B2Publication Date: 2020-05-26
- Inventor: Jonas Foelling
- Applicant: Leica Microsystems CMS GmbH
- Applicant Address: DE Wetzlar
- Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee: LEICA MICROSYSTEMS CMS GMBH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2613a552
- International Application: PCT/EP2015/080724 WO 20151221
- International Announcement: WO2016/097399 WO 20160623
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/36

Abstract:
A scanning microscope includes an objective and a scanning element that is adjustable for a time-variable deflection to guide a focused illumination beam across the sample in a scanning movement. A detection beam is guided across sensor elements of an image sensor in a movement which corresponds to the scanning movement of the focused illumination beam. A dispersive element of a predetermined dispersive effect arranged upstream of the image sensor spatially separates different spectral components of the detection beam from one another on the image sensor. A controller detects the time-variable adjustment of the scanning element, assigns the spatially separated spectral components of the detection beam to the sensor elements of the image sensor based on the detected time-variable adjustment, while taking into account the predetermined dispersive effect of the dispersive element, and individually reads out the sensor elements assigned to the spectral components.
Public/Granted literature
- US20170351071A1 SCANNING MICROSCOPE Public/Granted day:2017-12-07
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