Invention Grant
- Patent Title: Correlation microscope
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Application No.: US15765145Application Date: 2016-09-30
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Publication No.: US10663708B2Publication Date: 2020-05-26
- Inventor: Shinichiro Isobe , Takaaki Kanemaru , Shin-ichi Takasu , Koji Kosaka , Takashi Oe
- Applicant: NAKAMURA SANGYO GAKUEN , INTERNATIONAL SCIENCE TECHNOLOGY CO., LTD. , TCK INC.
- Applicant Address: JP Fukuoka JP Fukuoka JP Fukuoka
- Assignee: NAKAMURA SANGYO GAKUEN,INTERNATIONAL SCIENCE TECHNOLOGY CO., LTD.,TCK INC.
- Current Assignee: NAKAMURA SANGYO GAKUEN,INTERNATIONAL SCIENCE TECHNOLOGY CO., LTD.,TCK INC.
- Current Assignee Address: JP Fukuoka JP Fukuoka JP Fukuoka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2529bb2b com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@7707e6ab
- International Application: PCT/JP2016/079121 WO 20160930
- International Announcement: WO2017/057729 WO 20170406
- Main IPC: H01J37/20
- IPC: H01J37/20 ; G01N23/00 ; G02B21/26 ; G01N23/225 ; H01J37/16 ; H01J37/22 ; G02B21/36 ; G06K9/62 ; G06T7/33 ; G06T7/73 ; H01J37/18 ; G02B21/18 ; G01N23/2206 ; G06T1/00 ; G06K9/20

Abstract:
Coordinates of a first region extraction window, a first sample stage coordinate, a second sample stage coordinate, and a second region extraction window, including images of one sample stage and an observation target tissues of a sample when the one sample stage is respectively positioned on two microscopes are respectively obtained. Based on difference between the first sample stage coordinate and the second sample stage coordinate, the second sample stage coordinate is corrected. Based on the obtained corrected second sample stage coordinate, the second positioning unit is moved from the second non-observation position to the second observation position where the second region extraction window is located at a position corresponding to the coordinate position of the first region extraction window.
Public/Granted literature
- US20180356624A1 CORRELATION MICROSCOPE Public/Granted day:2018-12-13
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