Invention Grant
- Patent Title: Failure analysis program, failure analysis device, and failure analysis method
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Application No.: US15891787Application Date: 2018-02-08
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Publication No.: US10664340B2Publication Date: 2020-05-26
- Inventor: Hiroshi Otsuka , Yukihiro Watanabe , Masahiro Asaoka , Reiko Kondo , Ken Yokoyama
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@2f7eb5a0
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/07 ; G06Q10/00

Abstract:
A non-transitory computer-readable storage medium storing therein a failure analysis program that causes a computer to execute a process includes: extracting, for respective incidents, first material names that satisfy a first condition from character strings included in each incident; extracting, for the respective incidents, second material names, which are the same material names as the first material names, from the character strings included in each incident; calculating a combination of feature values corresponding respectively to the one or more features from character strings correlated with the extracted second material names, for the respective incidents and for the respective second material names; and specifying a specific combination that satisfies a second condition from the combinations of feature values corresponding to the respective material names, for the respective second material names.
Public/Granted literature
- US20180232270A1 FAILURE ANALYSIS PROGRAM, FAILURE ANALYSIS DEVICE, AND FAILURE ANALYSIS METHOD Public/Granted day:2018-08-16
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