Invention Grant
- Patent Title: Measurement apparatus and data processing method
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Application No.: US16176156Application Date: 2018-10-31
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Publication No.: US10664554B2Publication Date: 2020-05-26
- Inventor: Akihiro Ohori , Nobuyuki Hattori
- Applicant: DAIHEN Corporation
- Applicant Address: JP Osaka
- Assignee: DAIHEN Corporation
- Current Assignee: DAIHEN Corporation
- Current Assignee Address: JP Osaka
- Agency: Hamre, Schumann, Mueller & Larson, P.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@433cc440 com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@16f9ead5
- Main IPC: G06F17/18
- IPC: G06F17/18 ; G01R21/133 ; G01R19/02

Abstract:
A measurement apparatus is used in cooperation with another equivalent measurement apparatus. Each measurement apparatus includes a change amount calculator for calculating a change amount of measured values, an average value generator for generating a first internal average value based on the change amount, and a communication unit for receiving a second internal average value that was generated by at least one other measurement apparatus. The average value generator generates a third internal average value, using a computation result based on at least the first and second internal average values.
Public/Granted literature
- US20190065439A1 MEASUREMENT APPARATUS AND DATA PROCESSING METHOD Public/Granted day:2019-02-28
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