Invention Grant
- Patent Title: Grain quality monitoring
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Application No.: US15723073Application Date: 2017-10-02
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Publication No.: US10664726B2Publication Date: 2020-05-26
- Inventor: Carl Knox Wellington , Aaron J. Bruns , Victor S. Sierra , James J. Phelan , John M. Hageman , Cristian Dima , Hanke Boesch , Herman Herman , Zachary Abraham Pezzementi , Cason Robert Male , Joan Campoy , Carlos Vallespi-gonzalez
- Applicant: Deere and Company , Carnegie Mellon University
- Applicant Address: US IL Moline
- Assignee: Deere & Company
- Current Assignee: Deere & Company
- Current Assignee Address: US IL Moline
- Agency: Rathe Lindenbaum LLP
- Main IPC: G06K9/62
- IPC: G06K9/62 ; G06T7/00 ; G06T7/12 ; G06K9/00 ; G06K9/03 ; A01D41/127 ; G06K9/52 ; G06K9/34

Abstract:
A method and non-transitory computer-readable medium capture an image of bulk grain and apply a feature extractor to the image to determine a feature of the bulk grain in the image. For each of a plurality of different sampling locations in the image, based upon the feature of the bulk grain at the sampling location, a determination is made regarding a classification score for the presence of a classification of material at the sampling location. A quality of the bulk grain of the image is determined based upon an aggregation of the classification scores for the presence of the classification of material at the sampling locations.
Public/Granted literature
- US20180025254A1 GRAIN QUALITY MONITORING Public/Granted day:2018-01-25
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