Invention Grant
- Patent Title: Method for correcting a spatially resolved photon scan of an X-ray detector
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Application No.: US16202246Application Date: 2018-11-28
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Publication No.: US10665003B2Publication Date: 2020-05-26
- Inventor: Christoph Polster , Steffen Kappler , Edgar Goederer
- Applicant: Siemens Healthcare GmbH
- Applicant Address: DE Erlangen
- Assignee: SIEMENS HEALTHCARE GMBH
- Current Assignee: SIEMENS HEALTHCARE GMBH
- Current Assignee Address: DE Erlangen
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@785d839e
- Main IPC: A61B6/03
- IPC: A61B6/03 ; G06T11/00 ; G01T1/17 ; A61B6/00

Abstract:
A method and an X-ray detector are for correcting a spatially resolved photon scan of the X-ray detector. In an embodiment, the X-ray detector includes processing circuitry configured to: generate, from an incident X-ray photon, a signal contribution in a first electrical signal in a spatially resolved manner, a reference value being defined by an absence of X-ray photons; resolve, in relation to the reference value, positive signal contributions of the first electrical signal and negative signal contributions of the first electrical signal; and provide the positive signal contributions resolved and the negative signal contributions resolved for further processing.
Public/Granted literature
- US20190172231A1 METHOD FOR CORRECTING A SPATIALLY RESOLVED PHOTON SCAN OF AN X-RAY DETECTOR Public/Granted day:2019-06-06
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