Invention Grant
- Patent Title: Interface, electronic device and test method
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Application No.: US15547880Application Date: 2017-02-08
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Publication No.: US10665979B2Publication Date: 2020-05-26
- Inventor: Cheng Yang
- Applicant: BOE TECHNOLOGY GROUP CO., LTD. , K-TRONICS (SUZHOU) TECHNOLOGY CO., LTD.
- Applicant Address: CN Beijing CN Suzhou, Jiangsu
- Assignee: BOE TECHNOLOGY GROUP CO., LTD.,K-TRONICS (SUZHOU) TECHNOLOGY CO., LTD.
- Current Assignee: BOE TECHNOLOGY GROUP CO., LTD.,K-TRONICS (SUZHOU) TECHNOLOGY CO., LTD.
- Current Assignee Address: CN Beijing CN Suzhou, Jiangsu
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@43dec6b4
- International Application: PCT/CN2017/073114 WO 20170208
- International Announcement: WO2017/193656 WO 20171116
- Main IPC: G01R31/08
- IPC: G01R31/08 ; H01R13/46 ; H01R24/28 ; G01R31/69 ; H01R27/00 ; H01R101/00 ; G01R31/67

Abstract:
An interface, an electronic device and a test method, adapted to connect with at least two types of signal connectors to establish signal connection, the interface includes a connecting portion and a socket portion located at an end of the connecting portion; wherein the socket portion includes at least two types of portions of different identifiers respectively, and the identifiers respectively correspond to the signal connectors adapted to be plugged into the interface to establish signal connection.
Public/Granted literature
- US20180233844A1 INTERFACE, ELECTRONIC DEVICE AND TEST METHOD Public/Granted day:2018-08-16
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