Invention Grant
- Patent Title: Mode selection for inspection
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Application No.: US16364098Application Date: 2019-03-25
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Publication No.: US10670536B2Publication Date: 2020-06-02
- Inventor: Martin Plihal , Saravanan Paramasivam , Ankit Jain , Prasanti Uppaluri , Raghavan Konuru
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corp.
- Current Assignee: KLA-Tencor Corp.
- Current Assignee Address: US CA Milpitas
- Agent Ann Marie Mewherter
- Priority: com.zzzhc.datahub.patent.etl.us.BibliographicData$PriorityClaim@1a2f7591
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/95 ; G01N21/956

Abstract:
Methods and systems for selecting a mode for inspection of a specimen are provided. One method includes determining how separable defects of interest (DOIs) and nuisances detected on a specimen are in one or more modes of an inspection subsystem. The separability of the modes for the Dais and nuisances is used to select a subset of the modes for inspection of other specimens of the same type. Other characteristics of the performance of the modes may be used in combination with the separability to select the modes. The subset of modes selected based on the separability may also be an initial subset of modes for which additional analysis is performed to determine the final subset of the modes.
Public/Granted literature
- US20190302031A1 Mode Selection for Inspection Public/Granted day:2019-10-03
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