Invention Grant
- Patent Title: Techniques for control of non-destructive testing devices via a probe driver
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Application No.: US15967206Application Date: 2018-04-30
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Publication No.: US10670538B2Publication Date: 2020-06-02
- Inventor: Bryan Christopher Morris
- Applicant: General Electric Company
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G01N21/954
- IPC: G01N21/954

Abstract:
A probe driver may include a coupling that interfaces with a conduit section at a first position of the conduit section. A probe driver may also have one or more positioning elements to reposition the conduit section to interface with the coupling at a second position of conduit section in response to one or more commands based on a recorded inspection, where through completing the one or more commands is configured to initiate a second inspection identical to the recorded inspection.
Public/Granted literature
- US20190331613A1 TECHNIQUES FOR CONTROL OF NON-DESTRUCTIVE TESTING DEVICES VIA A PROBE DRIVER Public/Granted day:2019-10-31
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